Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
We have measured the temperature and magnetic field dependence of the low temperature resistivity of Au wires with dilute (∼50 ppm) Fe impurities as a function of wire width. In contrast to previous experiments, we find an increase in slope of the temperature dependent resistivity Δρ{variant}(T) as the wire width is decreased. A systematic trend is also evident in the field dependent resistivity Δρ{variant}(H). We also find an unusual scaling relation between Δρ{variant}(T) and Δρ{variant}(H) in our wider samples. © 1994.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Mark W. Dowley
Solid State Communications
T.N. Morgan
Semiconductor Science and Technology
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997