Discourse segmentation in aid of document summarization
B.K. Boguraev, Mary S. Neff
HICSS 2000
The soft-error resilience of the IBM POWER6™ processor I/O (input/ output) subsystem was measured using proton beam irradiation to accelerate the effect of single-event upsets. Test programs exercised each of the adapters on the chip. Error rates were measured for various cases ranging from idle to high I/O bandwidth and utilization. The POWER6 processor and I/O hub subsystem work together to maintain resiliency even under strenuous irradiation conditions. © Copyright 2008 by International Business Machines Corporation.
B.K. Boguraev, Mary S. Neff
HICSS 2000
Rajeev Gupta, Shourya Roy, et al.
ICAC 2006
Zohar Feldman, Avishai Mandelbaum
WSC 2010
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997