Matthias Kaiserswerth
IEEE/ACM Transactions on Networking
The soft-error resilience of the IBM POWER6™ processor I/O (input/ output) subsystem was measured using proton beam irradiation to accelerate the effect of single-event upsets. Test programs exercised each of the adapters on the chip. Error rates were measured for various cases ranging from idle to high I/O bandwidth and utilization. The POWER6 processor and I/O hub subsystem work together to maintain resiliency even under strenuous irradiation conditions. © Copyright 2008 by International Business Machines Corporation.
Matthias Kaiserswerth
IEEE/ACM Transactions on Networking
Bowen Zhou, Bing Xiang, et al.
SSST 2008
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Minkyong Kim, Zhen Liu, et al.
INFOCOM 2008