Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
The critical current density of single-, bi-, and polycrystalline Y1Ba2Cu3O7 films has been imaged by low Temperature Scanning Electron Microscopy (LTSEM) with a spatial resolution of 1/μ. Our experiments directly show that grain boundaries limit the critical current density in polycrystalline films. Substantial variatoons of the critical current density have also been found in high quality, c-axis oriented epitaxial films, which have critical current densities above 1×106A/cm2 at 77K. © 1989.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry