R. Ghez, J.S. Lew
Journal of Crystal Growth
The critical current density of single-, bi-, and polycrystalline Y1Ba2Cu3O7 films has been imaged by low Temperature Scanning Electron Microscopy (LTSEM) with a spatial resolution of 1/μ. Our experiments directly show that grain boundaries limit the critical current density in polycrystalline films. Substantial variatoons of the critical current density have also been found in high quality, c-axis oriented epitaxial films, which have critical current densities above 1×106A/cm2 at 77K. © 1989.
R. Ghez, J.S. Lew
Journal of Crystal Growth
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
Lawrence Suchow, Norman R. Stemple
JES