D.C. Worledge, G. Hu, et al.
IEDM 2010
A model of spin flop switching was developed to eliminate half select and activation energy in magnetic random access memory (MRAM). The model was developed for arbitrary thickness, length, width, magnetization, intrinsic anisotropy and exchange coupling on applied field. The field required to switch the bit under half select was found larger than the field required for full select. The activation energy was found to increase under application of a half select field and eliminated soft error problem.
D.C. Worledge, G. Hu, et al.
IEDM 2010
D.C. Worledge, P.L. Trouilloud, et al.
Journal of Applied Physics
Eugene J. O'Sullivan, Martin J. Gajek, et al.
ECS Transactions
D.C. Worledge, Guohan Hu
MRS Advances