Summary Abstract: Observation of final-state screening in inverse photoemission from adsorbed xenon layers

Michiel Sprik

Journal of Physics Condensed Matter

Shu-Jen Han, Dharmendar Reddy, et al.

ACS Nano

T.N. Morgan

Semiconductor Science and Technology

P. Martensson, R.M. Feenstra

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films