Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Paper

01 Jan 1988

Summary Abstract: Structure analysis of the GaAs(110) surface by scanning tunneling microscopy

View publication

Abstract

No abstract available.

Conference paper

NEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.

S. Cohen, T.O. Sedgwick, et al.

MRS Proceedings 1983

Paper

Characterization of large magnetic anisotropies in (100)- and (111)-oriented Co/Pt multilayers by Brillouin light scattering

J.V. Harzer, B. Hillebrands, et al.

Journal of Magnetism and Magnetic Materials

Paper

Effect of electron correlation in a narrow band

K.A. Chao

Physical Review B

Conference paper

X-ray lithography induced radiation effects in deep submicron CMOS devices

L.K. Wang, A. Acovic, et al.

MRS Spring Meeting 1993

View all publications