Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
An overview of surface and interface analysis within IBM is presented. The types of materials concerned; the areas in which surface analysis is having major impact; and the relative importance of different analytical techniques are discussed, together with perspectives for the future. Selected examples from Research Division work are presented to illustrate the range of materials work and techniques involved. © 1986 Springer-Verlag.
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989