Conference paper
SCANNING TUNNELING MICROSCOPY.
G. Binnig, H. Rohrer
ICPS Physics of Semiconductors 1984
Paper
Surface imaging by scanning tunneling microscopy
Abstract
We discuss the potential of a new technique for surface imaging on an atomic scale: scanning tunneling microscopy. Examples for 3D topographies of surfaces and work-function profiles are given. © 1983.
Related
K.W. Blazey, H. Rohrer
Physical Review
G. Binnig, H. Rohrer
IBM J. Res. Dev
R. Christoph, H. Siegenthaler, et al.
Electrochimica Acta