Conference paper
The impact of variability on power
Sani R. Nassif
ISLPED 2004
In this brief, a temperature-and variation-aware electromigration analysis (T-VEMA) tool for power grid wires is described. First, T-VEMA performs a two-stage interconnect thermal analysis on a full chip. Next, the tool extracts the effective jL product values and performs an electromigration (EM) lifetime calculation on ideally manufactured mortal wires on the basis of thermal effects. Finally, T-VEMA analyzes process variation effects on EM reliability at global and local levels and reports variation tolerances of EM-sensitive power grid wires.
Sani R. Nassif
ISLPED 2004
Sani R. Nassif
SISPAD 2006
Sani R. Nassif, Zhuo Li
ISQED 2005
Rouwaida Kanj, Zhuo Li, et al.
IEEE Trans Semicond Manuf