PaperContrast formation in Kelvin probe force microscopy of single π-conjugated moleculesBruno Schuler, Shi-Xia Liu, et al.Nano Letters
PaperLocal thickness determination of thin insulator films via localized statesWolfram Steurer, Leo Gross, et al.Applied Physics Letters
PaperAdsorption geometry determination of single molecules by atomic force microscopyBruno Schuler, Wei Liu, et al.Physical Review Letters
PaperUnraveling the Molecular Structures of Asphaltenes by Atomic Force MicroscopyBruno Schuler, Gerhard Meyer, et al.JACS
