Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Paper
The dependence of inelastic electron tunneling on junction roughness
Abstract
We have made a series of Al-Al2O3-benzoic acid-Pb inelastic electron tunneling spectroscopy (IETS) junctions on substrates roughened by varying thicknesses of CaF2. The vibrational peaks due to the molecular monolayer of benzoic acid disappear as the substrates are made rougher. We speculate on the cause of this disappearance. © 1983.
Related
R. Ghez, J.S. Lew
Journal of Crystal Growth
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020