A. Reisman, M. Berkenblit, et al.
JES
Photocurrent spectroscopy and transient photocurrent measurements are employed in order to investigate the change in barrier heights and density of traps within low-k dielectric films under bias stressing conditions. By characterizing these fundamental physical properties, we hope to gain an understanding of the processes leading to time-dependent dielectric breakdown. © 2009 Elsevier B.V. All rights reserved.
A. Reisman, M. Berkenblit, et al.
JES
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology