Conference paperTotal Source Mask Optimization: High-capacity, resist modeling, and production-ready mask solutionMoutaz Fakhry, Yuri Granik, et al.SPIE Photomask Technology + EUV Lithography 2011
PaperMapping behavioral specifications to model parameters in synthetic biologyHeinz Koeppl, Marc Hafner, et al.BMC Bioinformatics
Conference paperCompound semiconductor surface and interface problems in liquid phase epitaxy (lpe)M.B. Small, R.M. PotemskiProceedings of SPIE 1989
PaperEfficient Heuristics for Orientation Metric and Euclidean Steiner Tree Problems *Y.Y. Li, K.S. Leung, et al.J Combin Optim
