Thickness dependence of exchange bias and structure in MnPt and MnNi spin valves

Michael F. Toney; Mahesh G. Samant; Tsann Lin; Daniele Mauri

doi:10.1063/1.1528279

Applied Physics Letters

Paper

03 Dec 2002

Thickness dependence of exchange bias and structure in MnPt and MnNi spin valves

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Abstract

Thickness dependence of exchange bias and structure in MnPt and MnNi spin valves was discussed. X-ray diffraction and magnetic measurements were performed. Results showed that there is a strong correlation between chemical order and exchange coupling and the chemical order develops as the thickness increases.

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In-situ grazing incidence X-ray diffraction study of electrochemically deposited Pb monolayers on Ag(111)

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Abstract

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