Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Paper
Tracer diffusion in amorphous Pd80Si20 and Gd16Co84 films
Abstract
Evaporated Pd80Si20 and sputtered Gd16Co84 amorphous films were studied for structural relaxation during annealing with a Seeman-Bohlin X-ray diffractometer and for atomic diffusion using radioactive Au195 and Co57 tracers. The diffusion parameters for these two kinds of films with pre-annealing are presented. © 1982.
Related
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Mark W. Dowley
Solid State Communications
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter