PaperPolarization of thin phosphosilicate glass films in MGOS structuresJ.M. Eldridge, R.B. Laibowitz, et al.Journal of Applied Physics
PaperBase electrodes for high dielectric constant oxide materials in silicon technologyA. Grill, W. Kane, et al.Journal of Materials Research
PaperNucleation of small metal particles on ultrathin SiO2 films on SiL. Kasprzak, R.B. Laibowitz, et al.Thin Solid Films
PaperFabrication and josephson properties of NB3GER.B. Laibowitz, C.C. Tsuei, et al.IEEE Transactions on Magnetics