Lawrence Suchow, Norman R. Stemple
JES
The roughness of spin-cast polymer films arises from thermally activated capillary waves during preparation and typically amounts to about 0.5 nm rms measured on a micrometer-sized surface area. Templating from atomically flat mica substrates allows the creation of polymer films with a surface roughness approaching the molecular scale. Three regimes of spatial frequencies are identified in which the roughness is controlled by different physical mechanisms. We find that frozen-in elastic pressure waves ultimately limit the flatness of polymer films. © 2009 American Chemical Society.
Lawrence Suchow, Norman R. Stemple
JES
David B. Mitzi
Journal of Materials Chemistry
Ronald Troutman
Synthetic Metals
M. Hargrove, S.W. Crowder, et al.
IEDM 1998