PaperBias-stress-induced stretched-exponential time dependence of charge injection and trapping in amorphous thin-film transistorsFrank R. Libsch, Jerzy KanickiApplied Physics Letters
PaperObservation of multiple silicon dangling bond configurations in silicon nitrideD. Jousse, Jerzy Kanicki, et al.Applied Physics Letters
PaperTransport properties and defect states of a-Si:H grown by HOMOCVDJerzy Kanicki, C.M. Ransom, et al.Journal of Non-Crystalline Solids
PaperDefects in amorphous hydrogenated silicon nitride filmsJerzy Kanicki, W.L. WarrenJournal of Non-Crystalline Solids
