PaperEnergy and time-resolved photoemission in a promising new approach for contactless integrated-circuit testingH.K. Seitz, A. Blacha, et al.Microelectronic Engineering
PaperLaser-beam photoemission testing of ultrafast integrated circuitsR. Clauberg, H. BehaMikroelektronik
Paper17ps rise-time measurement by photoemission samplingA. Blacha, R. Clauberg, et al.Electronics Letters
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