PaperQuantitative oxygen measurements in OMVPE Al x Ga1-x As grown by methyl precursorsT.F. Kuech, R.M. Potemski, et al.Journal of Electronic Materials
PaperInvestigation of Tin films reactively sputtered using a sputter gunK.Y. Ahn, M. Wittmer, et al.Thin Solid Films
PaperInterface states and the barrier height of Schottky diodesM. Wittmer, J. FreeoufPhysics Letters A
