Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences

Paper

02 Jun 2014

Zur Röntgen-Fluoreszenz-Analyse dünner Legierungsschichten

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No abstract available.

Paper

Comment on "Misfit stress in InGaAs/InP heteroepitaxial structures grown by vapor-phase epitaxy" (Journal of Applied Physics (1985) 57 (249))

I.C. Noyan, Armin Segmüller

Journal of Applied Physics

Paper

Automatic x-ray diffraction measurement of the lattice curvature of substrate wafers for the determination of linear strain patterns

Armin Segmüller, J. Angilelo, et al.

Journal of Applied Physics

Paper

Smooth multilayer films suitable for x-ray mirrors

Rolf-Peter Haelbich, Armin Segmüller, et al.

Applied Physics Letters

Paper

Controlled fabrication of multilayer soft-x-ray mirrors

Eberhard Spiller, Armin Segmüller, et al.

Applied Physics Letters

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