PaperCharacterization of epitaxial films by grazing-incidence X-ray diffractionArmin SegmüllerThin Solid Films
PaperCharacterization of epitaxial (Ca,Ba)F2 films on Si(111) substratesM. Wittmer, D.A. Smith, et al.Applied Physics Letters
PaperPtSi contact metallurgy formed by three-temperature annealing sequences and short annealing timeChin-An Chang, Armin SegmüllerJournal of Applied Physics
