Stoichiometric and structural origin of electronic states at the Pd2Si-Si interface
- P.S. Ho
- P.E. Schmid
- et al.
- 1981
- Physical Review Letters
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14 results for H. Föll
Weak‐beam contrast of stacking faults in transmission electron microscopy
- H. Föll
- C.B. Carter
- et al.
- 1980
- physica status solidi (a)
TEM observations on grain boundaries in sintered silicon
- H. Föll
- D. Ast
- 1979
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Direct TEM determination of intrinsic and extrinsic stacking fault energies of silicon
- H. Föll
- C.B. Carter
- 1979
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties