POLYSILICON EMITTER RESISTANCE AND CARRIER TRANSPORT STUDIES.
- J.M.C. Stork
- C.Y. Wong
- et al.
- 1984
- VLSI Technology 1984
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64 results for J.M.C. Stork
Correlation Between the Diffusive and Electrical Barrier Properties of the Interface in Polysilicon Contacted n+-p Junctions
- Johannes M.C. Stork
- Maurizio Arienzo
- et al.
- 1985
- IEEE T-ED
Characterization of Non-Ohmic Behavior of Emitter Contacts of Bipolar Transistors
- B. Ricco
- J.M.C. Stork
- et al.
- 1984
- IEEE Electron Device Letters
Tunneling in Base-Emitter Junctions
- Johannes M. C. Stork
- Randall D. Isaac
- 1983
- IEEE T-ED