Microstructural changes in confined submicrometer aluminum films
- M.L. Chou
- S. Rishton
- et al.
- 1993
- Journal of Applied Physics
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2 results for Haydn Chen
An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces
- Haydn Chen
- G.E. White
- et al.
- 1982
- Thin Solid Films