Theory of ripple topography induced by ion bombardment
- R.Mark Bradley
- James M.E. Harper
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
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Theory of high-temperature oxide decomposition at the SiO2/Si interface
- R. Mark Bradley
- 1987
- Journal of Applied Physics
Summary abstract: Theory of thin-film orientation by ion bombardment during deposition
- R. Mark Bradley
- James M.E. Harper
- et al.
- 1987
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Origin of thickness oscillations in nucleated thin-film silicides
- R. Mark Bradley
- 1986
- Journal of Applied Physics
Theory of thin-film orientation by ion bombardment during deposition
- R. Mark Bradley
- James M. E. Harper
- et al.
- 1986
- Journal of Applied Physics