Thin-oxide dual-electron-injector annealing studies using conductivity and electron energy-loss spectroscopy
- L. Dori
- J. Bruley
- et al.
- 1991
- Journal of Applied Physics
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16 results for Leonello Dori
Sputtered tungsten for deep submicroncomplementary metal-oxide-semiconductor technology
- L. Dori
- A.C. Megdanis
- et al.
- 1990
- Thin Solid Films
Avalanche Electron Injection in 4-nm Si3N4/8-nm SiO2 Dielectric Structure: Turn-Around Phenomenon and Si-SiO2 Interface Degradation
- Leonello Dori
- Maurizio Severi
- et al.
- 1990
- IEEE T-ED
Ballistic electron transport in thin silicon dioxide films
- M.V. Fischetti
- D.J. Dimaria
- et al.
- 1987
- Physical Review B
Electron avalanche injection on 10-nm dielectric films
- Leonello Dori
- Maurizio Arienzo
- et al.
- 1987
- Journal of Applied Physics
Effect of post-oxidation anneal on ultrathin SiO2 gate oxides
- Maurizio Arienzo
- Leonello Dori
- et al.
- 1986
- Applied Physics Letters