Residual stress induced fracture in glass-sapphire composites: planar geometryY-H. ChiaoD.R. Clarke1990Acta Metallurgica Et Materialia
Residual stress induced fracture in glass-sapphire composites: cylindrical geometryD.R. ClarkeY-H. Chiao1990Acta Metallurgica Et Materialia
Application of transmission electron microscopy to the observation of dislocation emission from crack tips at elevated temperaturesDavid R. ClarkeYi-Hung Chiao1989Ultramicroscopy
Direct observation of dislocation emission from crack tips in silicon at high temperaturesY.-H. ChiaoD.R. Clarke1989Acta Metallurgica