Recombination Lifetime Profiling in Very Thin Si Epitaxial Layers Used for Bipolar VLSI
- Paolo Spirito
- S. Bellone
- et al.
- 1989
- IEEE Electron Device Letters
Publications
Date
Featured collections
Popular topics
2 results for G. Busatto
Recombination Measurement of n-Type Heavily Doped Layer in High/Low Silicon Junctions
- Salvatore Bellone
- Giovanni Busatto
- et al.
- 1991
- IEEE T-ED