Quantitative time‐of‐flight secondary ion mass spectrometry of a perfluorinated polyetherDavid E. FowlerRoboert D. Johnsonet al.2004Surface and Interface Analysis
Time-of-Flight Secondary Ion Mass Spectrometry of Perfluorinated PolyethersIoannis V. BletsosDavid M. Herculeset al.2002Analytical Chemistry