Monolithic Stacked FET with Stepped Channels for Future Logic TechnologiesChen ZhangSeungmin Songet al.2024IEDM 2024
From Lab to Fab - In-line SIMS for Process Control in Nanosheet Gate-All-Around Device ManufacturingStefan SchoecheKatherine Sieget al.2024SPIE Advanced Lithography + Patterning 2024