Extraction of interface trap density in high-k/Ge gate stacks and determination of the charge neutrality level
- D. Bozyigit
- C. Rossel
- 2009
- DRC 2009
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On the extraction of interface trap density in the Pt/La2O 3/Ge gate stack and the determination of the charge neutrality level in Ge
- D. Bozyigit
- C. Rossel
- 2009
- Journal of Applied Physics