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Alvin Joseph- John D. Cressler
- Michael C. Hamilton
- et al.
- 2001
- IEEE TNS
- D.R. Greenberg
- S. Sweeney
- et al.
- 2001
- Technical Digest - International Electron Devices Meeting
- S. Voldman
- P. Juliano
- et al.
- 2000
- EOS/ESD 2000
- S. Voldman
- P. Juliano
- et al.
- 2000
- Annual Proceedings - Reliability Physics (Symposium)