Diagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998
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18 results for Daniel R. Knebel
Importance of inductance and inductive coupling for on-chip wiring
- A. Deutsch
- H. Smith
- et al.
- 1997
- IEEE Topical Meeting EPEPS 1997
Design guidelines for short, medium, and long on-chip interconnections
- A. Deutsch
- W.D. Becker
- et al.
- 1996
- IEEE Topical Meeting EPEPS 1996
A multi-mode power gating structure for low-voltage deep-submicron CMOS ICs
- Suhwan Kim
- Stephen V. Kosonocky
- et al.
- 2007
- IEEE TCAS-II
Application of an SOI 0.12-μm CMOS technology to SoCs with low-power and high-frequency circuits
- Jean-Olivier Plouchart
- Noah Zamdmer
- et al.
- 2003
- IBM J. Res. Dev
Low-power circuits and technology for wireless digital systems
- Stephen V. Kosonocky
- Azeez J. Bhavnagarwala
- et al.
- 2003
- IBM J. Res. Dev
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
- M. McManus
- J.A. Kash
- et al.
- 2000
- Microelectronics Reliability
When are transmission-line effects important for on-chip interconnections?
- Alina Deutsch
- Gerard V. Kopcsay
- et al.
- 1997
- IEEE T-MTT