A high reliability Metal Insulator Metal capacitor for 0.18 μm Copper technology
- M. Armacost
- A. Augustin
- et al.
- 2000
- IEDM 2000
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2 results for Odin Prigge
CMOS with active well bias for low-power and RF/analog applications
- Clement Wann
- Jay Harrington
- et al.
- 2000
- Digest of Technical Papers-Symposium on VLSI Technology