Data retention in SOI-DRAM with trench capacitor cell
- Hussein I. Hanafi
- Thomas Kanarsky
- et al.
- 1998
- ESSDERC 1998
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History dependence of non-fully depleted (NFD) digital SOI circuits
- F. Assaderaghi
- G. Shahidi
- et al.
- 1996
- VLSI Technology 1996