Capacitance investigation of diode and GGNMOS for ESD protection of high frequency circuits in 45nm SOI CMOS technologies
- Junjun Li
- Souvick Mitra
- et al.
- 2008
- EOS/ESD 2008
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2 results for Michel J. Abou-Khalil
Analysis of failure mechanism on gate-silicided and gate-non-silicided, drain/source silicide-blocked ESD NMOSFETs in a 65nm bulk CMOS technology
- Junjun Li
- David Alvarez
- et al.
- 2006
- IPFA 2006