Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling
- Sokrates T. Pantelides
- L. Tsetseris
- et al.
- 2009
- ECS Meeting 2009
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Mechanical stability of possible structures of PtN investigated using first-principles calculations
- S.K.R. Patil
- S.V. Khare
- et al.
- 2006
- Physical Review B - CMMP