Distortion simulations with the PSP model: Common-gate circuits
- C. Michael Olsen
- Lawrence F. Wagner
- et al.
- 2007
- RFIC 2007
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RFCMOS technology from 0.25μm to 65nm: The state of the art
- J.J. Pekarik
- D.R. Greenberg
- et al.
- 2004
- CICC 2004