SiGe BiCMOS trends - today and tomorrow
- J. Dunn
- D.L. Harame
- et al.
- 2006
- CICC 2006
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5 results for L. Lanzerotti
Test methods, test techniques and failure criteria for evaluation of ESD degradation of analog and radio frequency (RF) technology
- Steven H. Voldman
- Brian Ronan
- et al.
- 2002
- EOS/ESD 2002
Electrostatic discharge characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors
- S. Voldman
- P. Juliano
- et al.
- 2000
- EOS/ESD 2000
Status and direction of communication technologies - SiGe BiCMOS and RFCMOS
- Alvin J. Joseph
- David L. Harame
- et al.
- 2005
- Proceedings of the IEEE
Foundation of rf CMOS and SiGe BiCMOS technologies
- James S. Dunn
- David C. Ahlgren
- et al.
- 2003
- IBM J. Res. Dev