VDD scaling for FinFET logic and memory circuits: The impact of process variations and SRAM stability
- C.-H. Lin
- K. Das
- et al.
- 2006
- VLSI-TSA 2006
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2 results for R.Q. Williams
Compact modeling of FinFETs featuring independent-gate operation mode
- C.-H. Lin
- X. Xi
- et al.
- 2005
- VLSI Technology 2005