Publications

2 results for Dominic C. Bruen

Latent defect screening for high-reliability glass-ceramic multichip module copper interconnects
- - Edward J. Yarmchuk
  - Christopher W. Cline
  - et al.
- 2005
- IBM J. Res. Dev
High-speed electrical testing of multichip ceramic modules
- - Dennis G. Manzer
  - John P. Karidis
  - et al.
- 2005
- IBM J. Res. Dev