Sub-aångstrom resolution using aberration corrected electron optics
- P.E. Batson
- N. Dellby
- et al.
- 2002
- Nature
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3 results for N. Dellby
Sub-angstrom probe size in HADF-STEM at 120KV
- Philip Batson
- N. Dellby
- et al.
- 2002
- Microscopy and Microanalysis
Progress in aberration-corrected scanning transmission electron microscopy
- N. Dellby
- L. Krivaneka
- et al.
- 2001
- Journal of Electron Microscopy