Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfacesKangguo ChengJinju Leeet al.2002IEEE Transactions on Electron Devices
Isotope exchange in hydrogenated silicon-oxynitride (SiON) for 1.55μm optical waveguide applicationsJinju LeeKangguo Chenget al.2000Materials Research Society Symposium-Proceedings