Time-resolved emission testing challenges for low voltage CMOS technologiesPeilin SongFranco Stellariet al.2003LEOS 2003
"Invited"-Picosecond imaging circuit analysis of ULSI microprocessorsMoyra K. Mc ManusPeilin Song2002IMS 2002
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysisS. PolonskyM. Mc Manuset al.2000ATS 2000