The combined effects of deuterium anneals and deuterated barrier-nitride processing on hot-electron degradation in MOSFET's
- Thomas G. Ference
- Jay S. Burnham
- et al.
- 1999
- IEEE Transactions on Electron Devices
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Nickel-alloyed tin-lead eutectic solder for surface mount technology
- Sung K. Kang
- Thomas G. Ference
- 1993
- Journal of Materials Research