INVESTIGATION OF HOT ELECTRON LUMINESCENCE IN SILICON BY MEANS OF DUAL-GATE MOSFET's
- Luca Selmi
- Hon-Sum Wong
- et al.
- 1993
- IEDM 1993
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2 results for Enrico Sangiorgi
Monitoring hot-carrier degradation in SOI MOSFET's by hot-carrier luminescence techniques
- Luca Selmi
- Maura Pavesi
- et al.
- 1998
- IEEE Transactions on Electron Devices