Publications

3 results for Daisuke Kato

Fault-tolerant designs for 256 Mb DRAM
- - Toshiaki Kirihata
  - Yohji Watanabe
  - et al.
- 1996
- IEEE Journal of Solid-State Circuits
A 286 mm² 256 Mb DRAM with ×32 both-ends DQ
- - Yohji Watanabe
  - Hing Wong
  - et al.
- 1996
- IEICE Transactions on Electronics
Fault-tolerant designs for 256 Mb DRAM
- - Toshiaki Kirihata
  - Yohji Watanabe
  - et al.
- 1996
- IEICE Transactions on Electronics