Hot electron phenomena in transport across metal-semiconductor structures
- R. Ludeke
- A. Bauer
- 1993
- MRS Fall Meeting 1993
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8 results for A. Bauer
Direct determination of impact ionization quantum yield in Si by ballistic-electron-emission microscopy
- A. Bauer
- R. Ludeke
- 1994
- Physical Review Letters
Hot electron scattering processes in metal films and at metal-semiconductor interfaces
- R. Ludeke
- A. Bauer
- 1993
- Physical Review Letters
Electrical transport properties of hot electrons at metal, insulator, and semiconductor interfaces
- R. Ludeke
- A. Bauer
- 1995
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Hot electron transport through metal-oxide-semiconductor structure studied by ballistic electron emission spectroscopy
- R. Ludeke
- A. Bauer
- et al.
- 1995
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Hot electron transport in SiO2 probed with a scanning tunnel microscope
- R. Ludeke
- A. Bauer
- et al.
- 1995
- Applied Physics Letters
Hot electron transport across metal-semiconductor interfaces probed by ballistic electron emission spectroscopy
- R. Ludeke
- A. Bauer
- 1994
- CMD 1994
Hot electron transport across metal-semiconductor interfaces probed by ballistic electron emission spectroscopy
- R. Ludeke
- A. Bauer
- 1994
- Physica Scripta