A packaging solution for optically testing wire-bonded chips
- Alberto Tosi
- Franco Stellari
- et al.
- 2008
- IEEE Transactions on Advanced Packaging
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95 results for Peilin Song
Angular spectrum tailoring in solid immersion microscopy for circuit analysis
- S.B. Ippolito
- P. Song
- et al.
- 2008
- Applied Physics Letters
CMOS IC diagnostics using the light emission from off-state leakage currents (LEOSLC)
- Peilin Song
- Stas Polonsky
- et al.
- 2005
- Electronic Device Failure Analysis
Testing and diagnostics of CMOS circuits using light emission from off-state leakage current
- Franco Stellari
- Peilin Song
- et al.
- 2004
- IEEE Transactions on Electron Devices
I/O interface latchup analysis using optical and electrical testing
- Franco Stellari
- Peilin Song
- et al.
- 2004
- Electronic Device Failure Analysis