Physical model of the impact of metal grain work function variability on emerging dual metal gate MOSFETs and its implication for SRAM reliability
- Xiao Zhang
- Jing Li
- et al.
- 2009
- IEDM 2009
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2 results for Blanka Magyari-Köpe
Recommended Methods to Study Resistive Switching Devices
- Mario Lanza
- H.-S. Philip Wong
- et al.
- 2018
- Advanced Electronic Materials